Quantitative dynamic force microscopy with inclined tip oscillation

• Philipp Rahe,
• Daniel Heile,
• Reinhard Olbrich and
• Michael Reichling

Beilstein J. Nanotechnol. 2022, 13, 610–619, doi:10.3762/bjnano.13.53

• for the investigation of in-plane material properties, such as the in-plane shear modulus [16]. Last, the influence of the inclination between oscillation direction and surface plane has been used in lateral force microscopy to determine the probe oscillation amplitude [17]. Here, we extend the

Determining amplitude and tilt of a lateral force microscopy sensor

• Oliver Gretz,
• Alfred J. Weymouth,
• Thomas Holzmann,
• Korbinian Pürckhauer and
• Franz J. Giessibl

Beilstein J. Nanotechnol. 2021, 12, 517–524, doi:10.3762/bjnano.12.42

• Oliver Gretz Alfred J. Weymouth Thomas Holzmann Korbinian Purckhauer Franz J. Giessibl Institute of Experimental and Applied Physics, Department of Physics, University of Regensburg, 93053 Regensburg, Germany 10.3762/bjnano.12.42 Abstract In lateral force microscopy (LFM), implemented as

• for a given amplitude and tilt. Finally, the amplitude and tilt are determined by fitting the simulation output to the data with oscillation. Keywords: frequency-modulation atomic force microscopy; lateral force microscopy; amplitude calibration; tilt estimation; Introduction Frequency-modulation

• is called lateral force microscopy (LFM) (Figure 1). One advantage to LFM is that it is highly sensitive to short-range interactions. A drawback is that it is not a suitable technique for approaching a sample or determining the sample tilt. Here a complementary technique such as STM (used in our

Exploring wear at the nanoscale with circular mode atomic force microscopy

• Olivier Noel,
• Aleksandar Vencl and
• Pierre-Emmanuel Mazeran

Beilstein J. Nanotechnol. 2017, 8, 2662–2668, doi:10.3762/bjnano.8.266

• lateral force microscopy (LFM) signal proportional to the friction force) of the cantilever stemming from the circular displacement of the contact features a sinusoidal signal with the same frequency as the relative circular displacement of the contact. Then a lock-in amplifier is used to register the

Probing fibronectin–antibody interactions using AFM force spectroscopy and lateral force microscopy

• Andrzej J. Kulik,
• Małgorzata Lekka,
• Kyumin Lee,
• Grazyna Pyka-Fościak and
• Wieslaw Nowak

Beilstein J. Nanotechnol. 2015, 6, 1164–1175, doi:10.3762/bjnano.6.118

• experiment showing the effects of specific interaction forces using lateral force microscopy (LFM) was demonstrated for lectin–carbohydrate interactions some years ago. Such measurements are possible under the assumption that specific forces strongly dominate over the non-specific ones. However, obtaining

• : fibronectin; lateral force microscopy; molecular recognition; torsional forces calibration; Introduction The invention of atomic force microscopy (AFM) opened up new areas of research as it can probe various biological structures with nanometer resolution, including images of DNA [1], proteins [2], and

• perpendicular (normal) to the surface and a relative position on a sample. In the AFM-FS measurement, force curves are recorded point-by-point, requiring a precise but tedious and very time consuming procedure. Lateral force microscopy (LFM), also called friction force microscopy (FFM) is another operational

A nanometric cushion for enhancing scratch and wear resistance of hard films

• Katya Gotlib-Vainshtein,
• Olga Girshevitz,
• Chaim N. Sukenik,
• David Barlam and
• Sidney R. Cohen

Beilstein J. Nanotechnol. 2014, 5, 1005–1015, doi:10.3762/bjnano.5.114

• Barbara, CA). To quantify the mechanical properties of the sample, the tip radius was determined by measurements on a reference sample of known modulus [50]. The Dimension ICON SPM is capable of measuring frictional forces on the surfaces of samples using lateral force microscopy (LFM). Frictional

• µN. Applied load vs friction force curves and µ evaluated by lateral force microscopy. FEA model for 7 nm titania layer for 10 nN force showing z-component of global stress distribution for a) PDMS substrate, and b) Si substrate. Inset shows the deformation, with z enlarged by 7× for PDMS and 70× for

Optimal geometry for a quartz multipurpose SPM sensor

• Julian Stirling

Beilstein J. Nanotechnol. 2013, 4, 370–376, doi:10.3762/bjnano.4.43

• a lateral mode without the need to excite torsional modes. The symmetry allows normal and lateral motion to be completely isolated, even when introducing large tips to tune the dynamic properties to optimal values. Keywords: atomic force microscopy; lateral force microscopy; lateral forces